Bulk Sample Analysis
The images on the left, taken by a white-light interferometric microscope, illustrate laser ablation craters. The top image shows the ablated spots from above the CIGS thin film. These ablation patterns are controlled by our Axiom system software. The center image illustrates a cross-section of the ablated crater whose depth is measured in microns. The bottom image shows a 3-D view of the ablated sample surface. The graph to the right shows LIBS emission peaks @ 588.9 nm and 589.5 nm that illustrate the presence of Sodium (Na).
Setting up a grid of arbitrary size for bulk analysis of Na in the CIGS thin film
