Laser Ablation · Femtosecond Tandem
Cirrus Femto
Ultimate analytical performance with femtosecond Tandem technology — ultra-precise laser sampling for exceptional spatial and depth resolution, sensitivity, and measurement precision.
Overview
Ultimate analytical performance
Cirrus Femto is Applied Spectra’s most advanced femtosecond Tandem platform, designed for demanding elemental and isotopic analysis where sampling precision and analytical performance are critical. Ultra-precise, high-speed femtosecond sampling delivers exceptional spatial and depth resolution while generating a finely controlled aerosol optimized for ICP-MS analysis — supporting high sensitivity, accuracy, measurement precision, and analytical throughput.
Cirrus can operate independently as a LIBS or LA-ICP-MS platform, or simultaneously in Tandem mode, combining complementary LIBS and ICP-MS information from the same laser sampling event. This enables major, light, trace elemental, and isotopic analysis across a broad concentration range from a single analytical platform.
Adaptive Burst-Mode
Optimized ablation for every material
Cirrus incorporates Adaptive Burst-Mode technology to precisely control femtosecond laser pulse delivery and optimize laser-material interaction for different sample types. Tailoring the pulse sequence to the material enables further optimization of ablation characteristics and analytical performance across diverse and challenging matrices.
Key Capabilities
What Cirrus Femto delivers
- Ultra-precise femtosecond laser ablation
- High sampling speed for rapid analysis and chemical imaging
- Adaptive Burst-Mode technology for material-specific ablation optimization
- LIBS, LA-ICP-MS, and simultaneous Tandem analysis
- High-resolution 2D/3D Tandem chemical imaging and depth profiling
- THP technology optimized for high-speed LA-ICP-MS and sensitive LIBS analysis
Applications
For the highest analytical performance
Cirrus Femto is designed for demanding applications where spatial resolution, depth resolution, sensitivity, or measurement precision are critical.
Nuclear Materials & Nuclear Forensics
High-precision elemental and isotopic analysis of nuclear materials, including precise characterization of microscopic particles encountered in nuclear forensic investigations.
Displays & Solar Thin Films
High-resolution depth profiling and characterization of multilayer film structures.
Contamination Analysis
Precise targeting and chemical identification of small contamination features.
Coatings & Surface Treatments
High-resolution depth profiling with sensitive elemental characterization of coatings, interfaces, and surface-modified layers.
Geoscience & Isotope Geochemistry
In-situ isotope-system analysis with MC-ICP-MS, high-resolution mineral imaging, and precise characterization of challenging geological materials, including quartz.
From Data to Analytical Insight
Powered by ClarityNeXt™
Cirrus integrates with ClarityNeXt™ for quantitative and qualitative analysis, material classification, and advanced 2D/3D chemical imaging. In Tandem operation, ClarityNeXt™ data fusion combines LIBS and LA-ICP-MS information for classification, screening, imaging, and quantitative analysis across a broad concentration range.