Laser Ablation · LA-ICP-MS
J200 LA
Advanced solid-state laser ablation for LA-ICP-MS — direct solid sampling with the flexibility to upgrade to Tandem LA-LIBS.
Overview
Direct solid sampling for LA-ICP-MS
J200 LA is a laser ablation platform for direct solid sampling to ICP-MS. Built around robust solid-state laser technology, it provides precise and reproducible sampling for trace elemental and isotopic analysis across a broad range of industrial, advanced, and geological materials.
J200 LA supports quantitative analysis, targeted analysis of inclusions and small features, high-speed elemental imaging, and depth profiling with minimal sample preparation. Fast-washout sampling technology enables efficient analysis and spatially resolved characterization across diverse materials and sample types.
Tandem LA-LIBS
Expand your analytical capabilities with Tandem LA-LIBS
A key advantage of J200 LA is its ability to be upgraded to Tandem LA-LIBS, combining the trace-element and isotopic capabilities of ICP-MS with the complementary elemental capabilities of LIBS. Tandem analysis expands access to major and light elements and elements that can be challenging for ICP-MS due to spectral interferences — providing a more complete picture of sample chemistry from a single analytical platform.
Key Capabilities
What J200 LA delivers
- Direct solid sampling to ICP-MS with minimal sample preparation
- Trace elemental and isotopic analysis
- Quantitative analysis
- Targeted analysis of inclusions and small features
- High-speed elemental imaging enabled by fast-washout Vertex THP technology
- Elemental and isotopic mapping and depth profiling
- Compatibility with ICP-MS systems from major manufacturers
- Upgradeable to Tandem LA-LIBS
Applications
Across advanced materials
J200 LA enables trace-level impurity, contamination, dopant, and isotopic analysis across a broad range of materials and applications.
- Glass and solar materials
- Battery materials
- High-purity quartz
- Critical minerals and mined ores
- Semiconductor materials
- Nuclear materials
- Precious metals
- Geological samples
From Data to Analytical Insight
Powered by ClarityNeXt™ and flexible for your application
J200 LA integrates with ClarityNeXt™ to transform time-resolved ICP-MS data into quantitative and qualitative analysis, material classification, and elemental imaging results. Automated analytical workflows help streamline analysis from data acquisition to final output.
J200 LA supports multiple laser configurations, allowing the system to be optimized for specific materials and analytical requirements. Applied Spectra’s application team can help identify the laser wavelength and configuration best suited to each analytical workflow.